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Tools

SEM(Scanning Electron Microscope)

Usage
Scanning Electron Microscope(SEM) allows observing the surface of sample in high resolution
Spec.
- Model : Quanta 200(FEI)
- Resolution : 3.5nm(30kV, HV Mode), 3.5nm(30kV, ESEM Mode), 15nm (3kV, LV Mode)
- Magnification : 6 ~ 1,000,000 X (High and Low Vacuum Mode)
- Acc. voltage : 200V~30kV
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